Experiment Italiano (Italy) A1-1 Problema 1: Conducibilità elettrica in due dimensioni (10 punti)
Scrivi i numeri da 0 a 9 nella seguente tabella: 0 1 2 3 4 5 6 7 8 9 Parte A. Misure con la sonda a 4 punti (4PP) (1.2 punti) A.1 (0.6 pt)
s=
I V I V Riporta i tuoi dati nel Grafico A.1.
Experiment Italiano (Italy) A1-2 Grafico A.1: Iin funzione di V A.2 (0.2 pt)
R=
A.3 (0.4 pt)
Parte B. Resistività laminare (0.3 punti) B.1 (0.3 pt)
Experiment Italiano (Italy) A1-3 Parte C. Misure per diverse dimensioni del campione (3.2 punti) C.1 (3 pt)
s=
Le colonne vuote possono essere usate per i risultati intermedi. w/s ̂R C.2 (0.2 pt) Per i tuoi risultati usa la tabella C.1.
Experiment Italiano (Italy) A1-4 Parte D. Fattore di correzione geometrico (1.9 punti) D.1 (1.0 pt) Riporta i tuoi dati sulla carta appropriata: lineare (Grafico D.1a), semilogaritmica (D.1b) o bilogaritmica (D.1c) nelle pagine seguenti. D.2 (0.9 pt)
a=
b=
Experiment Italiano (Italy) A1-5 Grafico D.1a: scala lineare:
Experiment Italiano (Italy) A1-6 Grafico D.1b: scala semilogaritmica:
1 2 3 4 5 6 7 8 9 10 2 3 4 5 6 7 8 9 100 2 3 4 5 6 7 8 9 1000
Experiment Italiano (Italy) A1-7 Grafico D1c: scala bilogaritmica:
1 2 3 4 5 6 7 8 9 10 2 3 4 5 6 7 8 9 100 1 2 3 4 5 6 7 8 10 2 3 4 5 6 7 8 100 2 3 4 5 6 7 8 1000
Experiment Italiano (Italy) A1-8 Parte E. Il wafer di silicio e il metodo di van der Pauw (3.4 punti)
Annota qui il numero del tuo wafer:
E.1 (0.4 pt) I V I V E.2 (0.4 pt)
Grafico E.2: Iin funzione di V
R4PP =
Experiment Italiano (Italy) A1-9 E.3 (0.2 pt)
w= f(w/s) =
E.4 (0.1 pt)
ρ□(4PP)
E.5 (0.6 pt)
Disegno (orientamento della corrente): I V
Experiment Italiano (Italy) A1-10 E.6 (0.6 pt)
Disegno (orientamento della corrente): I V
Experiment Italiano (Italy) A1-11 E.7 (0.5 pt)
Grafico E.7: Iin funzione di V
Experiment Italiano (Italy) A1-12 E.8 (0.4 pt) Calcolo:
ρ□(vdP) =
E.9 (0.1 pt)
ρ□(vdP) =
%
E.10 (0.1 pt)
Resistività dello strato sottile di cromo ρ=
Topic: Circuits, Electrostatics, Electromagnetism Metodi: Experimental Data Analysis, Graph Linearization, Error Propagation Competenze: Experimental Data Analysis, Graph Linearization, Error Propagation Objects: — Fonte: Testo (PDF) — p.1 Soluzione: Soluzioni (PDF)
Experiments Italian (Italy) A1-1 Problem 1: Electrical conductivity in two dimensions (10 points)
Enter the numbers 0 to 9 in the following table: 0 1 2 3 4 5 6 7 8 9 Part A. Measurements with the 4-point probe (4PP) (1.2 points) A.1 (0.6 pt)
s=
I V I V Please report your data in Chart A.1.
Experiments Italian (Italy) A1-2 Graph A.1: In the function of V A.2 (0.2 pt)
R=
A.3 (0.4 pt)
Part B. Laminated resistivity (0.3 points) B.1 (0.3 pt)
Experiments Italian (Italy) A1-3 Part C. Measurements for different sample sizes (3.2 points) C.1 (3 pt)
s=
The empty columns can be used for intermediate results. w/s ̂R C.2 (0.2 pt) For your results, use table C.1.
Experiments Italian (Italy) A1-4 The following is the list of the following: The following table shows the results of the calculation of the weighted average weight of the product: D.1 (1.0 pt) Report your data on the appropriate paper: linear (Chart D.1a), semilogarithmic (D.1b) or The following pages list the following statistics: D.2 (0.9 pt)
a=
b=
Experiments Italian (Italy) A1-5 The following is the list of the following:
Experiments Italian (Italy) A1-6 The following table shows the number of samples taken:
1 2 3 4 5 6 7 8 9 10 2 3 4 5 6 7 8 9 100 2 3 4 5 6 7 8 9 1000
Experiments Italian (Italy) A1-7 The following table shows the number of samples taken:
1 2 3 4 5 6 7 8 9 10 2 3 4 5 6 7 8 9 100 1 2 3 4 5 6 7 8 10 2 3 4 5 6 7 8 100 2 3 4 5 6 7 8 1000
Experiments Italian (Italy) A1-8 Part E. The silicon wafer and the van der Pauw method (3.4 points)
Write down your wafer number here:
E.1 (0.4 pt) I V I V E.2 (0.4 pt)
Figure E.2: In the function of V
R4PP =
Experiments Italian (Italy) A1-9 E.3 (0.2 pt)
w= f(w/s) =
E.4 (0.1 pt)
ρ□(4PP)
E.5 (0.6 pt)
Drawing (current direction): I V
Experiments Italian (Italy) A1-10 E.6 (0.6 pt)
Drawing (current direction): I V
Experiments Italian (Italy) A1-11 E.7 (0.5 pt)
Figure E.7: In the function of V
Experiments Italian (Italy) A1-12 E.8 (0.4 pt) Calculation:
The following is the list of the countries of the European Union:
E.9 (0.1 pt)
The following is the list of the countries of the European Union:
%
E.10 (0.1 pt)
Resistivity of the chromium thin layer ρ=
Topic: Circuits, Electrostatics, Electromagnetism Metodi: Experimental Data Analysis, Graph Linearization, Error Propagation Competenze: Experimental Data Analysis, Graph Linearization, Error Propagation Objects: — Fonte: Testo (PDF) — p.1 Soluzione: Soluzioni (PDF)